A microscopic picture of surface charge trapping in semiconductor nanocrystals

Journal of Chemical Physics

Volumn 138, Issue 20, 2013, Pages

  Mooney, Jonathan ^a   Krause, Michael M ^a   Saari, Jonathan I ^a   Kambhampati, Patanjali ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON-PHONON INTERACTIONS; NANOCRYSTALS; SURFACE CHARGE; SURFACE STATES;

ELECTRON PHONON COUPLINGS; ELECTRON TRANSFER THEORY; NATURE OF SURFACE; PHOTOLUMINESCENCE INTENSITIES; SEMICONDUCTOR NANOCRYSTALS; SPECTROSCOPIC TECHNIQUE; TEMPERATURE DEPENDENT; ULTRAFAST MEASUREMENTS;

CHARGE TRAPPING;

NANOPARTICLE;

CHEMISTRY; LUMINESCENCE; MICROSCOPY; RAMAN SPECTROMETRY; SEMICONDUCTOR; SURFACE PROPERTY; TEMPERATURE;

LUMINESCENCE; MICROSCOPY; NANOPARTICLES; SEMICONDUCTORS; SPECTRUM ANALYSIS, RAMAN; SURFACE PROPERTIES; TEMPERATURE;

EID: 84879365018     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4807054     Document Type: Article

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