Field emission characteristics of pristine and N-doped graphene measured by in-situ transmission electron microscopy

Journal of Applied Physics

Volumn 113, Issue 21, 2013, Pages

  Kashid, Ranjit V ^a   Yusop, Mohd Zamri ^b   Takahashi, Chisato ^b   Kalita, Golap ^b   Panchakarla, Leela S ^c   Joag, Dilip S ^a   More, Mahendra A ^a   Tanemura, Masaki ^b  

^a UNIVERSITY OF PUNE   (India)

^b NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

^c NATIONAL CHEMICAL LABORATORY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL CONDUCTIVITY; EMISSION CURRENT; FIELD EMISSION CURRENTS; FIELD-EMISSION CHARACTERISTICS; IN-SITU TRANSMISSION ELECTRON MICROSCOPIES; NITROGEN-DOPING; STRUCTURAL DEFORMATION; TURN-ON VOLTAGES;

ELECTRIC CONDUCTIVITY; FIELD EMISSION; GRAPHENE; TRANSMISSION ELECTRON MICROSCOPY;

DOPING (ADDITIVES);

EID: 84879344343     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4809930     Document Type: Article

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