Lattice positions of Sn in Cu2ZnSnS4 nanoparticles and thin films studied by synchrotron X-ray absorption near edge structure analysis

Applied Physics Letters

Volumn 102, Issue 22, 2013, Pages

  Zillner, E ^a   Paul, A ^b   Jutimoosik, J ^c   Chandarak, S ^c   Monnor, T ^c   Rujirawat, S ^c   Yimnirun, R ^c   Lin, X Z ^a   Ennaoui, A ^a   Dittrich, Th ^a   Lux Steiner, M ^a  

^a HAHN MEITNER INSTITUT   (Germany)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^c SURANAREE UNIVERSITY OF TECHNOLOGY   (Thailand)

Author keywords

[No Author keywords available]

Indexed keywords

ANTI-SITE DEFECT; DEFECT SITES; LATTICE POSITIONS; SYNCHROTRON X RAYS; THIN FILM SOLAR CELLS; X-RAY ABSORPTION NEAR-EDGE STRUCTURE; XANES ANALYSIS; XANES SPECTRA;

ABSORPTION SPECTRA; DEFECTS; NANOPARTICLES; TIN; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY; X RAY ANALYSIS;

THIN FILMS;

EID: 84879121452     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4809824     Document Type: Article

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