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Applied Physics Letters

Volumn 99, Issue 26, 2011, Pages

Determination of secondary phases in kesterite Cu 2ZnSnS 4 thin films by x-ray absorption near edge structure analysis

(5) Just, Justus a,b Ltzenkirchen Hecht, Dirk b Frahm, Ronald b Schorr, Susan a Unold, Thomas a

a HAHN MEITNER INSTITUT (Germany)

b UNIVERSITY OF WUPPERTAL (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSOLUTE ACCURACY; ELECTRICAL PERFORMANCE; KESTERITES; LINEAR COMBINATIONS; QUANTITATIVE DETERMINATIONS; REFERENCE SPECTRUM; SECONDARY PHASIS; STRONG CORRELATION; SULFUR K-EDGE; X-RAY ABSORPTION NEAR-EDGE STRUCTURE;

ABSORPTION SPECTRA; SULFUR; THIN FILMS; TIN; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY; X RAY ABSORPTION SPECTROSCOPY; X RAY ANALYSIS; ZINC SULFIDE;

SULFUR DETERMINATION;

EID: 84855645433 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3671994 Document Type: Article

Times cited : (109)

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