Analysis of lattice site occupancy in kesterite structure of Cu 2ZnSnS4 films using synchrotron radiation x-ray diffraction

Journal of Applied Physics

Volumn 110, Issue 7, 2011, Pages

  Washio, Tsukasa ^a   Nozaki, Hiroshi ^a   Fukano, Tatsuo ^a   Motohiro, Tomoyoshi ^a   Jimbo, Kazuo ^b   Katagiri, Hironori ^b  

^a Rd Management Section   (Japan)

^b NAGAOKA NATIONAL COLLEGE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION RATIO; KESTERITES; LATTICE SITES; PHOTOVOLTAIC GENERATION; SITE OCCUPANCY; SYNCHROTRON RADIATION X-RAY DIFFRACTIONS;

CRYSTAL STRUCTURE; DIFFRACTION PATTERNS; INTERFEROMETRY; RIETVELD ANALYSIS; SYNCHROTRON RADIATION; SYNCHROTRONS; THIN FILMS; TIN; X RAY DIFFRACTION; X RAY POWDER DIFFRACTION; ZINC;

COPPER;

EID: 80054978673     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3642993     Document Type: Article

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