Simple analysis method for determining internal quantum efficiency and relative recombination ratios in light emitting diodes

Applied Physics Letters

Volumn 102, Issue 21, 2013, Pages

  Yoo, Yang Seok ^a   Roh, Tae Moo ^a   Na, Jong Ho ^b   Son, Sung Jin ^b   Cho, Yong Hoon ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b LG Innotek Co Ltd   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; EFFICIENCY; LIGHT EMITTING DIODES; QUALITY CONTROL; SEMICONDUCTOR QUANTUM WELLS; X RAY DIFFRACTION ANALYSIS;

ARBITRARY EXCITATIONS; CARRIER RECOMBINATION; DIFFERENT SUBSTRATES; HIGH RESOLUTION X RAY DIFFRACTION; INTERNAL QUANTUM EFFICIENCY; MATERIAL QUALITY; NONRADIATIVE RECOMBINATION PROCESS; TIME-RESOLVED PHOTOLUMINESCENCE;

QUANTUM EFFICIENCY;

EID: 84879102285     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4807485     Document Type: Article

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