Band alignment in partial and complete ZnO/ZnS/CdS/CuSCN extremely thin absorber cells: An X-ray photoelectron spectroscopy study

ACS Applied Materials and Interfaces

Volumn 5, Issue 11, 2013, Pages 5156-5164

  Edri, Eran ^a   Cohen, Hagai ^a   Hodes, Gary ^a  

^a WEIZMANN INSTITUTE OF SCIENCE   (Israel)

Author keywords

band diagram; CREM; ETA cells; LiSCN; semiconductor sensitized; V oc limit

Indexed keywords

BAND DIAGRAMS; CREM; EXTREMELY THIN ABSORBER SOLAR CELLS; EXTREMELY THIN ABSORBERS; LISCN; PHOTOVOLTAIC CONVERSION; SEMICONDUCTOR-SENSITIZED; X-RAY PHOTOELECTRON SPECTROSCOPY STUDIES;

ELECTRIC FIELDS; PHOTOELECTRONS; SOLAR CELLS; X RAY PHOTOELECTRON SPECTROSCOPY;

ALIGNMENT;

EID: 84879102220     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am401010f     Document Type: Article

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