Enhanced duplication: A technique to correct soft errors in narrow values

IEEE Computer Architecture Letters

Volumn 12, Issue 1, 2013, Pages 13-16

  Karsli, I Burak ^a   Reviriego, Pedro ^b   Balli, M Fatih ^a   Ergin, Oǧuz ^a   Maestro, J A ^b  

^a TOBB UNIVERSITY OF ECONOMICS AND TECHNOLOGY   (Turkey)

^b UNIVERSIDAD ANTONIO DE NEBRIJA   (Spain)

Author keywords

Error checking; Redundant design

Indexed keywords

ARCHITECTURAL LEVELS; CIRCUIT LEVELS; DATA CORRUPTION; ERROR-CHECKING; RADIATION PARTICLES; REDUNDANT DESIGN; TRANSIENT ERRORS; UNUSED REGISTERS;

COMPUTER ARCHITECTURE; HARDWARE;

ERRORS;

EID: 84879047255     PISSN: 15566056     EISSN: None     Source Type: Journal    
DOI: 10.1109/L-CA.2012.6     Document Type: Article

References (11)

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