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Volumn 8680, Issue , 2013, Pages

Novel error mode analysis method for graphoepitaxial directed self-assembly lithography based on the dissipative particle dynamics method

Author keywords

Direct self assembly lithography; Dissipative particle dynamics method

Indexed keywords

DIRECTED SELF-ASSEMBLY LITHOGRAPHIES; DISSIPATIVE PARTICLE DYNAMICS; DISSIPATIVE PARTICLE DYNAMICS METHOD; ERROR MODE; PROCESS CONDITION; SELF-ASSEMBLING MATERIALS;

EID: 84878395432     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.2011439     Document Type: Conference Paper
Times cited : (30)

References (8)
  • 1
    • 84878380932 scopus 로고    scopus 로고
    • Field-based simulations of directed block copolymer assembly
    • S9.01
    • Glenn Fredrickson, "Field-based simulations of directed block copolymer assembly", 2012 MRS Fall Meeting and Exhibit, S9.01, (2012).
    • (2012) 2012 MRS Fall Meeting and Exhibit
    • Fredrickson, G.1
  • 4
    • 84878386431 scopus 로고    scopus 로고
    • Dissipative particle dynamics simulations to optimize contact hole shrink process using graphoepitaxial directed self-assembly
    • to be submitted
    • Hironobu Sato, Hiroki Yonemitsu, Yuriko Seino, Hirokazu Kato, Masahiro Kanno, Katsutoshi Kobayashi, Ayako Kawanishi, Katsuyoshi Kodera, and Tsukasa Azuma, "Dissipative particle dynamics simulations to optimize contact hole shrink process using graphoepitaxial directed self-assembly", Proc. SPIE Advanced lithography 2013 to be submitted.
    • (2013) Proc. SPIE Advanced Lithography
    • Sato, H.1    Yonemitsu, H.2    Seino, Y.3    Kato, H.4    Kanno, M.5    Kobayashi, K.6    Kawanishi, A.7    Kodera, K.8    Azuma, T.9


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.