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Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 31, Issue 3, 2013, Pages

Validity of automated x-ray photoelectron spectroscopy algorithm to determine the amount of substance and the depth distribution of atoms

(1) Tougaard, Sven a

a UNIVERSITY OF SOUTHERN DENMARK (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERISTIC LENGTH; DEPTH DISTRIBUTION; ELECTRON INELASTIC MEAN FREE PATHS; INELASTICALLY SCATTERED; PEAK INTENSITY; SPECTRAL ENERGY; SYSTEMATIC STUDY; VARYING THICKNESS;

ALGORITHMS; PHOTOELECTRONS; X RAY PHOTOELECTRON SPECTROSCOPY;

ATOMS;

EID: 84877783770 PISSN: 07342101 EISSN: None Source Type: Journal
DOI: 10.1116/1.4795246 Document Type: Article

Times cited : (10)

References (12)

1
- 84874589069
- in, edited by D. Briggs and J. T. Grant (IM Publications, Chichester), Cha
- M. P. Seah, in X-ray Photoelectron and Auger Spectroscopy, edited by, D. Briggs, and, J. T. Grant, (IM Publications, Chichester, 2003), Chap., p. 345.
- (2003) X-ray Photoelectron and Auger Spectroscopy , pp. 345
- Seah, M.P.¹

2
- 84909835511
- 10.1116/1.576956
- C. J. Powell and M. P. Seah, J. Vac. Sci. Technol. A 8, 735 (1990). 10.1116/1.576956
- (1990) J. Vac. Sci. Technol. A , vol.8 , pp. 735
- Powell, C.J.¹ Seah, M.P.²

3
- 0000216113
- 10.1116/1.579963
- S. Tougaard, J. Vac. Sci. Technol. A 14, 1415 (1996). 10.1116/1.579963
- (1996) J. Vac. Sci. Technol. A , vol.14 , pp. 1415
- Tougaard, S.¹

4
- 0024765243
- 10.1002/sia.740141109
- S. Tougaard and H. S. Hansen, Surf. Interface Anal. 14, 730 (1989). 10.1002/sia.740141109
- (1989) Surf. Interface Anal. , vol.14 , pp. 730
- Tougaard, S.¹ Hansen, H.S.²

5
- 0032047486
- 10.1002/(SICI)1096-9918(199804)26:4<249::AID-SIA368>3.0.CO;2-A
- S. Tougaard, Surf. Interface Anal. 26, 249 (1998). 10.1002/(SICI)1096- 9918(199804)26:4<249::AID-SIA368>3.0.CO;2-A
- (1998) Surf. Interface Anal. , vol.26 , pp. 249
- Tougaard, S.¹

6
- 19044370398
- Ver. 5.3. See.
- S. Tougaard, quases: Software package for quantitative XPS/AES of surface nanostructures by peak shape analysis., Ver. 5.3 (2011). See: www.quases.com.
- (2011) Quases: Software Package for Quantitative XPS/AES of Surface Nanostructures by Peak Shape Analysis
- Tougaard, S.¹

7
- 0042030908
- 10.1116/1.1564040
- S. Tougaard, J. Vac. Sci. Technol. A 21, 1081 (2003) 10.1116/1.1564040
- (2003) J. Vac. Sci. Technol. A , vol.21 , pp. 1081
- Tougaard, S.¹

8
- 31044444348
- 10.1116/1.1864053
- S. Tougaard, J. Vac. Sci. Technol. A 23, 741 (2005). 10.1116/1.1864053
- (2005) J. Vac. Sci. Technol. A , vol.23 , pp. 741
- Tougaard, S.¹

9
- 33745981844
- 10.1016/j.susc.2006.05.020
- S. Hajati, S. Coultas, C. Blomfield, and S. Tougaard, Surf. Sci. 600, 3015 (2006). 10.1016/j.susc.2006.05.020
- (2006) Surf. Sci. , vol.600 , pp. 3015
- Hajati, S.¹ Coultas, S.² Blomfield, C.³ Tougaard, S.⁴

10
- 42449109220
- 10.1002/sia.2633
- S. Hajati, S. Coultas, C. Blomfield, and S. Tougaard, Surf. Interface Anal. 40, 688 (2008). 10.1002/sia.2633
- (2008) Surf. Interface Anal. , vol.40 , pp. 688
- Hajati, S.¹ Coultas, S.² Blomfield, C.³ Tougaard, S.⁴

11
- 52049119006
- 10.1016/j.susc.2008.08.005
- S. Hajati, S. Tougaard, J. Walton, and N. Fairley, Surf. Sci. 602, 3064 (2008). 10.1016/j.susc.2008.08.005
- (2008) Surf. Sci. , vol.602 , pp. 3064
- Hajati, S.¹ Tougaard, S.² Walton, J.³ Fairley, N.⁴

12
- 0031094877
- 10.1002/(SICI)1096-9918(199703)25:3<137::AID-SIA230>3.0.CO;2-L
- S. Tougaard, Surf. Interface Anal. 25, 137 (1997). 10.1002/(SICI)1096- 9918(199703)25:3<137::AID-SIA230>3.0.CO;2-L
- (1997) Surf. Interface Anal. , vol.25 , pp. 137
- Tougaard, S.¹

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