SI realization of small forces using an electrostatic force balance

18th IMEKO World Congress 2006: Metrology for a Sustainable Development

Volumn 1, Issue , 2006, Pages 407-412

  Pratt, Jon R ^a   Kramar, John A ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Atomic force microscope; Electrostatic force balance; Force calibration; Instrumented indentation; Small force measurement; Standard references and practices

Indexed keywords

ATOMIC FORCE MICROSCOPE (AFM); FORCE CALIBRATION; GRAVITATIONAL FIELDS; INDEPENDENT MEASUREMENT; INSTRUMENTED INDENTATION; MEASUREMENT PRINCIPLE; NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY; SMALL FORCES;

ATOMIC FORCE MICROSCOPY; ELECTROSTATIC DEVICES; ELECTROSTATIC FORCE; GRAVITATION; METRIC SYSTEM; PLANNING; SUSTAINABLE DEVELOPMENT;

UNCERTAINTY ANALYSIS;

EID: 84877775272     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)

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