SCOPUS 정보 검색 플랫폼

Applied Physics Letters

Volumn 102, Issue 18, 2013, Pages

Enhanced measurement of broadband nanomechanical property of polymers using atomic force microscope

(6) Ren, Juan a Mousavi, Aliyeh a Li, Xuemei b Zou, Qingze a Erina, Natalia c Su, Chanmin c

a RUTGERS UNIVERSITY (United States)

b GUIZHOU UNIVERSITY (China)

c Bruker Corporation (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPE (AFM); CANTILEVER DEFLECTION; CONTROL TECHNIQUES; CONVENTIONAL METHODS; DIFFERENT DENSITIES; MEASUREMENT TIME; NANOMECHANICAL MEASUREMENTS; NANOMECHANICAL PROPERTY;

ATOMIC FORCE MICROSCOPY; NANOCANTILEVERS; PIEZOELECTRIC ACTUATORS; SILICONES;

POLYMERS;

EID: 84877747391 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4804381 Document Type: Article

Times cited : (16)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.