An ultra-compact virtual source FET model for deeply-scaled devices: Parameter extraction and validation for standard cell libraries and digital circuits

Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Volumn , Issue , 2013, Pages 521-526

  Yu, Li ^a   Mysore, Omar ^a   Wei, Lan ^a   Daniel, Luca ^a   Antoniadis, Dimitri ^a   Elfadel, Ibrahim ^a,b   Boning, Duane ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b KHALIFA UNIVERSITY   (United Arab Emirates)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL CIRCUIT APPLICATIONS; LOW-POWER DESIGN; MODEL RESULTS; NANOMETER TECHNOLOGY; RIPPLE CARRY ADDERS; SHORT-CHANNEL EFFECT; STANDARD CELL; VIRTUAL SOURCES;

COMPUTER SIMULATION; DIGITAL LIBRARIES; ELECTRIC BATTERIES; LIBRARIES; PARAMETER EXTRACTION; PRODUCT DESIGN;

COMPUTER AIDED DESIGN;

EID: 84877737277     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ASPDAC.2013.6509649     Document Type: Conference Paper

References (12)

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