Universal trapping mechanism in semiconductor nanocrystals

Nano Letters

Volumn 13, Issue 5, 2013, Pages 2047-2052

  Califano, Marco ^a   Gómez Campos, Francisco M ^b,c  

^a UNIVERSITY OF LEEDS   (United Kingdom)

^b UNIVERSITY OF GRANADA   (Spain)

^c Department of Computer Architecture and Computer Technology   (Spain)

Author keywords

Auger processes; impurities; nanocrystal quantum dots; pseudopotential method; surface; Trapping

Indexed keywords

AUGER PROCESS; DIFFERENT MECHANISMS; EFFICIENCY ENHANCEMENT; NANO-CRYSTAL MATERIALS; NANOCRYSTAL QUANTUM DOTS; PSEUDOPOTENTIAL METHOD; SEMICONDUCTOR NANOCRYSTALS; TRAPPING;

IMPURITIES; OPTICAL PROPERTIES; SURFACES;

NANOCRYSTALS;

EID: 84877311508     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl4003014     Document Type: Article

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