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Volumn 42, Issue 4, 2013, Pages 692-700

Characterization of n-type and p-type ZnS thin layers grown by an electrochemical method

Author keywords

Electrodeposition; n type ZnS; p type ZnS; semiconductors; thin films

Indexed keywords

DEPOSITION SOLUTION; ELECTROCHEMICAL METHODS; N-TYPE ZNS; OPTICAL ABSORPTION MEASUREMENT; P-TYPE; POST DEPOSITION ANNEALING; TWO-ELECTRODE SYSTEMS; X-RAY DIFFRACTION MEASUREMENTS;

EID: 84876502303     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-012-2393-y     Document Type: Article
Times cited : (36)

References (39)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.