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Volumn 273, Issue , 2013, Pages 645-651

Magnetic properties and microstructure of Tb x Dy 1-x Fe 2 thin films sputtered on Pt/TiO 2 /SiO 2 /Si substrate

Author keywords

Ferromagnetism; Magnetization; Microstructure; Sputtering; TERFENOL D; Thin film

Indexed keywords

DYSPROSIUM ALLOYS; FERROMAGNETISM; FILM GROWTH; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IRON ALLOYS; MAGNETIC PROPERTIES; MAGNETIZATION; MAGNETOSTRICTIVE DEVICES; MICROSTRUCTURE; PLATINUM ALLOYS; SILICON ALLOYS; SPUTTERING; SUBSTRATES; TERBIUM ALLOYS; TERNARY ALLOYS; THICK FILMS; THIN FILM DEVICES; TITANIUM ALLOYS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 84876406889     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2013.02.101     Document Type: Article
Times cited : (8)

References (26)
  • 17
    • 0033455689 scopus 로고    scopus 로고
    • Method for cross-sectional transmission electron microscopy specimen preparation of composite materials using a dedicated focused ion beam system
    • T. Yaguchi, T. Kamino, T. Ishitani, and R. Urao Method for cross-sectional transmission electron microscopy specimen preparation of composite materials using a dedicated focused ion beam system Microscopy and Microanalysis 5 1999 363
    • (1999) Microscopy and Microanalysis , vol.5 , pp. 363
    • Yaguchi, T.1    Kamino, T.2    Ishitani, T.3    Urao, R.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.