Synchrotron X-ray imaging applied to solar photovoltaic silicon

Journal of Physics: Conference Series

Volumn 425, Issue PART 19, 2013, Pages

  Lafford, T A ^a   Villanova, J ^a   Plassat, N ^b   Dubois, S ^b   Camel, D ^b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b DIF   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; DEFECT DENSITY; DEFECTS; IMAGING TECHNIQUES; INDUCED CURRENTS; INTERFACES (MATERIALS); SEMICONDUCTING INDIUM COMPOUNDS; SILICON; SOLAR CONCENTRATORS; SOLAR POWER GENERATION; SURFACE DEFECTS; SYNCHROTRON RADIATION; SYNCHROTRONS; X RAY ANALYSIS; X RAY DIFFRACTION; X RAY OPTICS;

LIGHT BEAM INDUCED CURRENTS; MANUFACTURING PROCESS; MICRO X-RAY FLUORESCENCE; PHOTOVOLTAIC PERFORMANCE; SIMULTANEOUS MEASUREMENT; SOLAR CELL PROCESSING; SURFACES AND INTERFACES; X-RAY DIFFRACTION IMAGING;

SOLAR CELLS;

EID: 84876259607     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/425/19/192019     Document Type: Conference Paper

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