X-ray diffraction topography using a diffractometer with a bendable monochromator at a synchrotron radiation source

Journal of Synchrotron Radiation

Volumn 9, Issue 5, 2002, Pages 282-286

  Altin, D ^a   Hartwig J ^a   Kohler R ^a   Ludwig, W ^a   Ohler, M ^a   Klein, H ^a  

^a SIEMENS AG   (Germany)

Author keywords

X ray diffraction topography

Indexed keywords

ARTICLE;

EID: 0036742749     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049502010294     Document Type: Article

References (15)

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