Quick X-ray reflectometry in the simultaneous multiple angle-wavelength dispersive mode

Journal of Physics: Conference Series

Volumn 425, Issue PART 9, 2013, Pages

  Arakawa, E ^a   Voegeli, W ^b   Matsushita, T ^b   Yano, Y F ^c   Hatano, T ^d  

^a TOKYO GAKUGEI UNIVERSITY   (Japan)

^b INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

^c KINKI UNIVERSITY   (Japan)

^d TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; MOMENTUM TRANSFER; SILICON; SILICON WAFERS; SYNCHROTRON RADIATION; SYNCHROTRONS; X RAY OPTICS;

BENDING MAGNET SOURCE; MONOCHROMATOR CRYSTALS; REFLECTIVITY CURVE; SPECULAR X-RAY REFLECTIVITIES; TWO-DIMENSIONAL DETECTORS; WAVELENGTH DISPERSIVE; WHITE SYNCHROTRON BEAM; X-RAY REFLECTOMETRY;

REFLECTION;

EID: 84876211019     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/425/9/092002     Document Type: Conference Paper

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