Curved crystal X-ray optics for a new type of high speed, multiwavelength dispersive X-ray reflectometer

Journal of Physics: Conference Series

Volumn 83, Issue 1, 2007, Pages

  Matsushita, Tadashi ^a   Inada, Yasuhiro ^a   Niwa, Yasuhiro ^a   Ishii, Masashi ^b   Sakurai, Kenji ^b   Nomura, Masaharu ^a  

^a INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36549087133     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/83/1/012021     Document Type: Article

References (10)

1. Stoev K N and Sakurai K 1999 Spectrochimica Acta B 54 41-82
2. Gibaud A and Hazra S 2000 Current Sci. 78 12-25
3. Sakurai K, Mizusawa M and Ishii M 2007 Trans MRS-Japan 32 181-186
4. White JW, Brown AS, Garrett RF, King DJ and Dowling TL 1999 Aust. J. Phys. 52 87-100
5. Garrett RF, White J W, King DJ, Dowling TL and Fulllagar W 2001 Nucl. Instrum. Meth. A 467-468 998-1000
6. The term multiwavelength dispersive is used to distinguish the present method from the conventional wavelength dispersive method. The term wavelength dispersive is mostly used in the field of the X-ray fluorescence spectroscopy: a crystal is used to analyze the energy of fluorescent X-rays from a specimen and a single wavelength component is picked up. The fluorescence spectrum is obtained by rotating the crystal and the detector. However, the method reported here is new and different from the conventional wavelength dispersive method in that reflectivity is measured simultaneously for multiple wavelengths without any mechanical motion of the crystal and the specimen.
7. Matsushita T and Phyzackerley RP 1981 Japan. J. Appl. Phys. 20 2223-2228
8. Mori T, Nomura M, Sato M, Adachi H, Uchida Y, Toyoshima A, Yamamoto S, Tsuchiya K, Shioya T and Kawata H 2004 AIP Conf. Proc. vol 705 p 255-258
9. Inada Y, Suzuki A, Niwa Y and Nomura M 2006 AIP Conf. Proc. vol 879 p 1230-1233
10. Matsushita T, Niwa Y, Inada Y, Nomura M, Ishii M, Sakurai K and Arakawa E to be submitted