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Volumn 1, Issue 11, 2013, Pages 2131-2135

Ab initio study of electronic and optical behavior of two-dimensional silicon carbide

Author keywords

[No Author keywords available]

Indexed keywords

AB INITIO STUDY; ELECTRONIC AND OPTICAL PROPERTIES; GEOMETRIC CONFIGURATIONS; IN-PLANE STRAINS; INTERLAYER SPACINGS; LAYERED NANOSTRUCTURE; OPTICAL BEHAVIOR; PHYSICAL THICKNESS;

EID: 84875852952     PISSN: 20507534     EISSN: 20507526     Source Type: Journal    
DOI: 10.1039/c3tc00629h     Document Type: Article
Times cited : (181)

References (48)
  • 1
    • 0003597031 scopus 로고
    • INSPEC Institution of Electrical Engineers, London
    • Properties of Silicon Carbide, ed., G. L. Harris, INSPEC Institution of Electrical Engineers, London, 1995
    • (1995) Properties of Silicon Carbide
    • Harris, G.L.1
  • 37
    • 0003996732 scopus 로고    scopus 로고
    • EMW Publishing, Cambridge, Massachusetts, USA
    • J. A. Kong, Electromagnetic Wave Theory, EMW Publishing, Cambridge, Massachusetts, USA, 2008
    • (2008) Electromagnetic Wave Theory
    • Kong, J.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.