-
2
-
-
33845622840
-
-
U. Kasavajjula, C. Wang, and A. J. Appleby, J. Power Sources, 163, 1003 (2007).
-
(2007)
J. Power Sources
, vol.163
, pp. 1003
-
-
Kasavajjula, U.1
Wang, C.2
Appleby, A.J.3
-
4
-
-
70249098409
-
-
D. Mazouzi, B. Lestriez, L. Roue, and D. Guyomard, Electrochem. Solid-State Lett., 12, A215 (2009).
-
(2009)
Electrochem. Solid-State Lett.
, vol.12
-
-
Mazouzi, D.1
Lestriez, B.2
Roue, L.3
Guyomard, D.4
-
5
-
-
67649967717
-
-
B. Key, R. Bhattacharyya, M. Morcrette, V. Seznéc, J. M. Tarascon, and C. P. Grey, J. Am. Chem. Soc., 131, 9239 (2009).
-
(2009)
J. Am. Chem. Soc.
, vol.131
, pp. 9239
-
-
Key, B.1
Bhattacharyya, R.2
Morcrette, M.3
Seznéc, V.4
Tarascon, J.M.5
Grey, C.P.6
-
6
-
-
13444249659
-
-
W. R. Liu, M. H. Yang, H. C. Wu, S. M. Chiao, and N. L. Wu, Electrochem. Solid-State Lett., 8, A100 (2005).
-
(2005)
Electrochem. Solid-State Lett.
, vol.8
-
-
Liu, W.R.1
Yang, M.H.2
Wu, H.C.3
Chiao, S.M.4
Wu, N.L.5
-
7
-
-
33749120306
-
-
H. Buqa, M. Holzapfel, F. Krumeich, C. Veit, and P. Novák, J. Power Sources, 161, 617 (2006).
-
(2006)
J. Power Sources
, vol.161
, pp. 617
-
-
Buqa, H.1
Holzapfel, M.2
Krumeich, F.3
Veit, C.4
Novák, P.5
-
8
-
-
37549013741
-
-
S. D. Beattie, D. Larcher, M. Morcrette, B. Simon, and J. M. Tarascon, J. Electrochem. Soc., 155, A158 (2008).
-
(2008)
J. Electrochem. Soc.
, vol.155
-
-
Beattie, S.D.1
Larcher, D.2
Morcrette, M.3
Simon, B.4
Tarascon, J.M.5
-
10
-
-
33748701840
-
-
L. B. Chen, X. H. Xie, J. Y. Xie, K. Wang, and J. Yang, J. Appl. Electrochem., 36, 1099 (2006).
-
(2006)
J. Appl. Electrochem.
, vol.36
, pp. 1099
-
-
Chen, L.B.1
Xie, X.H.2
Xie, J.Y.3
Wang, K.4
Yang, J.5
-
11
-
-
77957691070
-
-
V. A. Sethuraman, V. Srinivasan, A. F. Bower, and P. R. Guduru, J. Electrochem. Soc., 157, A1253 (2010).
-
(2010)
J. Electrochem. Soc.
, vol.157
-
-
Sethuraman, V.A.1
Srinivasan, V.2
Bower, A.F.3
Guduru, P.R.4
-
12
-
-
79952363710
-
-
A. F. Bower, P. R. Guduru, and V. A. Sethuraman, J. Mech. Phys. Solids, 59, 804 (2011).
-
(2011)
J. Mech. Phys. Solids
, vol.59
, pp. 804
-
-
Bower, A.F.1
Guduru, P.R.2
Sethuraman, V.A.3
-
13
-
-
77950301248
-
-
V. A. Sethuraman, M. J. Chon, M. Shimshak, V. Srinivasan, and P. R. Guduru, J. Power Sources, 195, 5062 (2010).
-
(2010)
J. Power Sources
, vol.195
, pp. 5062
-
-
Sethuraman, V.A.1
Chon, M.J.2
Shimshak, M.3
Srinivasan, V.4
Guduru, P.R.5
-
14
-
-
79961096465
-
-
M. J. Chon, V. A. Sethuraman, A. McCormick, V. Srinivasan, and P. R. Guduru, Phys. Rev. Lett., 107, 045503 (2011).
-
(2011)
Phys. Rev. Lett.
, vol.107
, pp. 045503
-
-
Chon, M.J.1
Sethuraman, V.A.2
McCormick, A.3
Srinivasan, V.4
Guduru, P.R.5
-
16
-
-
84857920025
-
-
V. A. Sethuraman, N. Van Winkle, D. P. Abraham, A. F. Bower, and P. R. Guduru, J. Power Sources, 206, 334 (2012).
-
(2012)
J. Power Sources
, vol.206
, pp. 334
-
-
Sethuraman, V.A.1
Van Winkle, N.2
Abraham, D.P.3
Bower, A.F.4
Guduru, P.R.5
-
17
-
-
77956685342
-
-
V. A. Sethuraman, K. Kowolik, and V. Srinivasan, J. Power Sources, 196, 393 (2011).
-
(2011)
J. Power Sources
, vol.196
, pp. 393
-
-
Sethuraman, V.A.1
Kowolik, K.2
Srinivasan, V.3
-
18
-
-
0002555366
-
Curvature-based techniques for real-time stress measurement during thin film growth
-
Edited by O. Auciello and A. R. Krauss, John Wiley & Sons, Inc., New York
-
J. A. Floro and E. Chason, "Curvature-based techniques for real-time stress measurement during thin film growth," In Situ Real-Time Characterization of Thin Films, Edited by O. Auciello and A. R. Krauss, John Wiley & Sons, Inc., New York (2001).
-
(2001)
Situ Real-Time Characterization of Thin Films
-
-
Floro, J.A.1
Chason, E.2
-
19
-
-
0001982897
-
-
March
-
C. Taylor, D. Barlett, E. Chason, and J. Floro, The Industrial Physicist, March 1998, p. 26-30.
-
(1998)
The Industrial Physicist
, pp. 26-30
-
-
Taylor, C.1
Barlett, D.2
Chason, E.3
Floro, J.4
-
21
-
-
0142159473
-
-
Cambridge University Press, Cambridge, United Kingdom
-
L. B. Freund and S. Suresh, Thin Film Materials: Stress, Defect Formation and Surface Evolution, Cambridge University Press, Cambridge, United Kingdom (2004).
-
(2004)
Thin Film Materials: Stress, Defect Formation and Surface Evolution
-
-
Freund, L.B.1
Suresh, S.2
-
22
-
-
0037465265
-
-
P. Limthongkul, Y.-I. Jiang, N. J. Dudney, and Y.-M. Chiang, Acta Materialia, 51, 1103 (2003).
-
(2003)
Acta Materialia
, vol.51
, pp. 1103
-
-
Limthongkul, P.1
Jiang, Y.-I.2
Dudney, N.J.3
Chiang, Y.-M.4
-
23
-
-
0038686005
-
-
P. Limthongkul, Y.-I. Jiang, N. J. Dudney, and Y.-M. Chiang, J. Power Sources, 119-121, 604 (2003).
-
(2003)
J. Power Sources
, vol.119-121
, pp. 604
-
-
Limthongkul, P.1
Jiang, Y.-I.2
Dudney, N.J.3
Chiang, Y.-M.4
-
25
-
-
8344245433
-
-
J. H. Ryu, J. W. Kim, Y.-E. Sung, and S. M. Oh, Electrochem. Solid State Lett., 7, A306 (2004).
-
(2004)
Electrochem. Solid State Lett.
, vol.7
-
-
Ryu, J.H.1
Kim, J.W.2
Sung, Y.-E.3
Oh, S.M.4
-
27
-
-
0037293825
-
-
Z. S. Wen, J. Yang, B. F. Wang, K. Wang, and Y. Liu, Electrochem. Comm., 5, 165 (2003).
-
(2003)
Electrochem. Comm.
, vol.5
, pp. 165
-
-
Wen, Z.S.1
Yang, J.2
Wang, B.F.3
Wang, K.4
Liu, Y.5
-
28
-
-
0346339797
-
-
X.-W. Zhang, P. K. Patil, C. Wang, A. J. Appleby, F. E. Little, and D. L. Cocke, J. Power Sources, 125, 206 (2004).
-
(2004)
J. Power Sources
, vol.125
, pp. 206
-
-
Zhang, X.-W.1
Patil, P.K.2
Wang, C.3
Appleby, A.J.4
Little, F.E.5
Cocke, D.L.6
-
29
-
-
0037167975
-
-
J. Shim, R. Kostecki, T. Richardson, X. Song, and K. A Striebel, J. Power Sources, 112, 222 (2002).
-
(2002)
J. Power Sources
, vol.112
, pp. 222
-
-
Shim, J.1
Kostecki, R.2
Richardson, T.3
Song, X.4
Striebel, K.A.5
-
31
-
-
77956438518
-
-
N. Balke, S. Jesse, Y. Kim, L. Adamczyk, A. Tselev, I. N. Ivanov, N. J. Dudney, and S. V. Kalinin, Nano Lett., 10, 3420 (2010).
-
(2010)
Nano Lett.
, vol.10
, pp. 3420
-
-
Balke, N.1
Jesse, S.2
Kim, Y.3
Adamczyk, L.4
Tselev, A.5
Ivanov, I.N.6
Dudney, N.J.7
Kalinin, S.V.8
-
32
-
-
78650726546
-
-
N. Balke, S. Jesse, Y. Kim, L. Adamczyk, I. N. Ivanov, N. J. Dudney, and S. V. Kalinin, ACS Nano, 4, 7349 (2010).
-
(2010)
ACS Nano
, vol.4
, pp. 7349
-
-
Balke, N.1
Jesse, S.2
Kim, Y.3
Adamczyk, L.4
Ivanov, I.N.5
Dudney, N.J.6
Kalinin, S.V.7
-
33
-
-
39349095556
-
-
N. A. Fleck, L. T. Kuhn, and R. M. McMeeking, J. Mech. Phys. Solids, 40, 1139 (1992).
-
(1992)
J. Mech. Phys. Solids
, vol.40
, pp. 1139
-
-
Fleck, N.A.1
Kuhn, L.T.2
McMeeking, R.M.3
-
35
-
-
79955537753
-
-
J.-S. Bridel, T. Azais, M. Morcrette, J.-M. Tarascon, and D. Larcher, J. Electrochem. Soc., 158, A750 (2011).
-
(2011)
J. Electrochem. Soc.
, vol.158
-
-
Bridel, J.-S.1
Azais, T.2
Morcrette, M.3
Tarascon, J.-M.4
Larcher, D.5
-
36
-
-
84875741473
-
Plastic-deformationinduced morphological evolution of aggregated si particles
-
H. Wang, V. A. Sethuraman, P. R. Guduru, and V. B. Shenoy, "Plastic-deformationinduced Morphological Evolution of Aggregated Si Particles," Meeting Abstracts - Electrochemical Society, 1201, 519 (2012).
-
(2012)
Meeting Abstracts - Electrochemical Society
, vol.1201
, pp. 519
-
-
Wang, H.1
Sethuraman, V.A.2
Guduru, P.R.3
Shenoy, V.B.4
-
38
-
-
0017984679
-
-
R. Aberman, R. Kramer, and J. Maser, Thin Solid Films, 52, 215 (1978).
-
(1978)
Thin Solid Films
, vol.52
, pp. 215
-
-
Aberman, R.1
Kramer, R.2
Maser, J.3
-
39
-
-
0345412538
-
-
P. R. Guduru, E. Chason, and L. B. Freund, J. Mech. Phys. Solids, 51, 2127 (2003).
-
(2003)
J. Mech. Phys. Solids
, vol.51
, pp. 2127
-
-
Guduru, P.R.1
Chason, E.2
Freund, L.B.3
-
40
-
-
0038822024
-
-
K. C. Woo, W. A. Kamitakahara, D. P. Di Vincenzo, D. S. Robinson, H. Mertwoy, J. W. Milliken, and J. E. Fischer, Phys. Rev. Lett., 50, 182 (1983).
-
(1983)
Phys. Rev. Lett.
, vol.50
, pp. 182
-
-
Woo, K.C.1
Kamitakahara, W.A.2
Di Vincenzo, D.P.3
Robinson, D.S.4
Mertwoy, H.5
Milliken, J.W.6
Fischer, J.E.7
-
41
-
-
0035929899
-
-
X.-D. Fan, Y.-L. Hsieh, J. M. Krochta, and M. J. Kurth, J. Appl. Polym. Sci., 82, 1921 (2001).
-
(2001)
J. Appl. Polym. Sci.
, vol.82
, pp. 1921
-
-
Fan, X.-D.1
Hsieh, Y.-L.2
Krochta, J.M.3
Kurth, M.J.4
-
42
-
-
79151484378
-
-
A. Magasinski, B. Zdyrko, I. Kovalenko, B. Hertzberg, R. Burtovyy, C. F. Huebner, T. F. Fuller, I. Luzinov, and G. Yushin, Appl. Mater. Interfaces, 2, 3004 (2010).
-
(2010)
Appl. Mater. Interfaces
, vol.2
, pp. 3004
-
-
Magasinski, A.1
Zdyrko, B.2
Kovalenko, I.3
Hertzberg, B.4
Burtovyy, R.5
Huebner, C.F.6
Fuller, T.F.7
Luzinov, I.8
Yushin, G.9
-
43
-
-
0032076740
-
-
Z. H. Liu, Ph. Maréchal, and R. Jérôme, Polymer, 39, 1779 (1998).
-
(1998)
Polymer
, vol.39
, pp. 1779
-
-
Liu, Z.H.1
Maréchal, P.2
Jérôme, R.3
-
44
-
-
0030704418
-
-
W. N. Sharpe, Jr., B. Yuan, R. Vaidyanathan, and R. L. Edwards, Proc. IEEE 10th Annual International Workshop on Micro Electro Mechanical Systems, pp. 424-429 (1997).
-
(1997)
Proc. IEEE 10th Annual International Workshop on Micro Electro Mechanical Systems
, pp. 424-429
-
-
Sharpe Jr., W.N.1
Yuan, B.2
Vaidyanathan, R.3
Edwards, R.L.4
-
46
-
-
0023570948
-
Measurement of complex coefficients for thick PVDF polymer
-
Denver, Colorado
-
Q. C. Xu, A. R. Ramachandran, R. E. Newnham, and R. H. Tancrell, "Measurement of complex coefficients for thick PVDF polymer," Proc. IEEE Ultrasonics Symposium, Denver, Colorado, pp. 663-666 (1987).
-
(1987)
Proc. IEEE Ultrasonics Symposium
, pp. 663-666
-
-
Xu, Q.C.1
Ramachandran, A.R.2
Newnham, R.E.3
Tancrell, R.H.4
|