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Volumn 160, Issue 4, 2013, Pages

Stress evolution in composite silicon electrodes during lithiation/delithiation

Author keywords

[No Author keywords available]

Indexed keywords

CARBOXYMETHYL CELLULOSE; COMPOSITE ELECTRODE; DIAGNOSTIC TECHNIQUES; ELECTROCHEMICAL CYCLING; ELECTROCHEMICAL LITHIATION; IN-SITU STRESS MEASUREMENT; LITHIATION/DELITHIATION; POLYVINYLIDENE FLUORIDES;

EID: 84875740243     PISSN: 00134651     EISSN: 19457111     Source Type: Journal    
DOI: 10.1149/2.021306jes     Document Type: Article
Times cited : (65)

References (47)
  • 18
    • 0002555366 scopus 로고    scopus 로고
    • Curvature-based techniques for real-time stress measurement during thin film growth
    • Edited by O. Auciello and A. R. Krauss, John Wiley & Sons, Inc., New York
    • J. A. Floro and E. Chason, "Curvature-based techniques for real-time stress measurement during thin film growth," In Situ Real-Time Characterization of Thin Films, Edited by O. Auciello and A. R. Krauss, John Wiley & Sons, Inc., New York (2001).
    • (2001) Situ Real-Time Characterization of Thin Films
    • Floro, J.A.1    Chason, E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.