Indentation of highly charged PSPM brushes measured by force spectroscopy: Application of a compressible fluid model

Macromolecules

Volumn 46, Issue 6, 2013, Pages 2323-2330

  Cuellar, José Luis ^a   Llarena, Irantzu ^b   Moya, Sergio Enrique ^b,c   Donath, Edwin ^a  

^a UNIVERSITY OF LEIPZIG   (Germany)

^b CIC BIOMAGUNE   (Spain)

^c ZHEJIANG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COMPRESSIBLE FLUIDS; DEBYE SCREENING LENGTH; FORCE SPECTROSCOPY; FORCE-DISTANCE CURVES; LONG-RANGE REPULSIONS; PHENOMENOLOGICAL EQUATIONS; POLYELECTROLYTE BRUSHES; SWELLING PRESSURES;

ATOMIC FORCE MICROSCOPY; CURVE FITTING; EQUATIONS OF STATE; IONIC STRENGTH; PROBES; SILICA;

BRUSHES;

EID: 84875679773     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma302562v     Document Type: Article

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