AC characterization of organic thin-film transistors with asymmetric gate-to-source and gate-to-drain overlaps

Organic Electronics

Volumn 14, Issue 5, 2013, Pages 1318-1322

  Zaki, Tarek ^a,b   Rödel, Reinhold ^c   Letzkus, Florian ^b   Richter, Harald ^b   Zschieschang, Ute ^c   Klauk, Hagen ^c   Burghartz, Joachim N ^a,b  

^a UNIVERSITY OF STUTTGART   (Germany)

^b Institut fur Mikroelektronik Stuttgart   (Germany)

^c MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

Organic thin film transistors; Scattering parameters; Small signal model

Indexed keywords

ALIGNMENT; EQUIVALENT CIRCUITS; FIELD EFFECT TRANSISTORS; HETEROJUNCTION BIPOLAR TRANSISTORS; SCATTERING PARAMETERS; SEMICONDUCTING ORGANIC COMPOUNDS; THIN FILM TRANSISTORS; THIN FILMS;

ASYMMETRIC GATES; HIGH RESOLUTION; ORGANIC THIN FILM TRANSISTOR (OTFTS); ORGANIC THIN FILM TRANSISTORS; S-PARAMETER CHARACTERIZATION; SMALL SIGNAL EQUIVALENT CIRCUIT; SMALL SIGNAL MODEL; SUPPLY VOLTAGES;

THIN FILM CIRCUITS;

EID: 84875356156     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2013.02.014     Document Type: Article

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