Intrinsic capacitance characteristics of top-contact organic thin-film transistors

IEEE Transactions on Electron Devices

Volumn 57, Issue 9, 2010, Pages 2344-2347

  Kim, Kangmin ^a   Kim, Youngmin ^b  

^a SAMSUNG Electronics   (South Korea)

^b Hong Ik University   (South Korea)

Author keywords

Overlap capacitance of source drain (S D); pentacene organic thin film transistor (OTFT)

Indexed keywords

CAPACITANCE MODEL; CHARGE CONTROL; CHARGE STORAGE; DC BIAS VOLTAGE; INTRINSIC CAPACITANCE; MEASURED RESULTS; ORGANIC THIN FILM TRANSISTORS; OVERLAP CAPACITANCE; PENTACENES;

CAPACITANCE; CHEMICAL SENSORS; POLYSTYRENES; SEMICONDUCTING ORGANIC COMPOUNDS;

THIN FILM TRANSISTORS;

EID: 77956056274     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2010.2055312     Document Type: Article

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