Microstructural characterization of CIGS formation using different selenization processes

Applied Surface Science

Volumn 270, Issue , 2013, Pages 139-144

  Liao, Kuang Hsiang ^a   Su, Cherng Yuh ^a   Ding, Yu Ting ^a   Koo, Horng Show ^b  

^a NATIONAL TAIPEI UNIVERSITY OF TECHNOLOGY   (Taiwan)

^b MINGHSIN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

CIGS thin films; Compositional variation; Isothermal selenization; Two zone selenization

Indexed keywords

COPPER ALLOYS; FILM PREPARATION; GALLIUM; GALLIUM ALLOYS; INDIUM ALLOYS; ISOTHERMS; MICROSTRUCTURE; SELENIUM; TERNARY ALLOYS;

CIGS THIN FILMS; COMPOSITIONAL VARIATION; MICRO-STRUCTURAL CHARACTERISTICS; MICRO-STRUCTURAL CHARACTERIZATION; POROUS MICROSTRUCTURE; SELENIZATION; SELENIZATION PROCESS; SELENIZATION TEMPERATURES;

THIN FILMS;

EID: 84875226920     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2012.12.142     Document Type: Article

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