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Volumn 33, Issue 2, 1998, Pages 339-345

CuInSe2 thin films formed by selenization of Cu-In precursors

Author keywords

[No Author keywords available]

Indexed keywords

COPPER COMPOUNDS; ELECTRODEPOSITION; ELECTROLESS PLATING; FILM GROWTH; PHASE TRANSITIONS; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 0031646920     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1004311527795     Document Type: Article
Times cited : (31)

References (22)
  • 15
    • 0003495856 scopus 로고    scopus 로고
    • International Center for Powder Diffraction Standards, Swarthmore, PA
    • Joint Committee for Powder Diffraction Standards, "Powder diffraction file (International Center for Powder Diffraction Standards, Swarthmore, PA.
    • Powder Diffraction File


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.