Measurement of elastic properties in fluid using high bandwidth atomic force microscope probes

Applied Physics Letters

Volumn 102, Issue 10, 2013, Pages

  Vijayraghavan, K ^a   Wang, A ^b   Solgaard, O ^a   Butte, M J ^b   Melosh, N A ^c  

^a STANFORD UNIVERSITY   (United States)

^b STANFORD UNIVERSITY   (United States)

^c Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPE (AFM); ELASTIC PROPERTIES; HIGH FREQUENCY HF; HIGH-SPEED MAPPINGS; PHOTODIODE SIGNALS; PHYSICAL QUANTITIES; STYRENE COPOLYMERS; TIP-SAMPLE INTERACTION;

ATOMIC FORCE MICROSCOPY; BANDWIDTH; POLYSTYRENES; PROBES; SIGNAL PROCESSING; STYRENE;

ELASTICITY;

EID: 84875198323     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4795598     Document Type: Article

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