Nanocrystalline SnO2 thin films: Structural, morphological, electrical transport and optical studies

Journal of Alloys and Compounds

Volumn 563, Issue , 2013, Pages 300-306

  Sakhare, R D ^a   Khuspe, G D ^a   Navale, S T ^a   Mulik, R N ^a   Chougule, M A ^a   Pawar, R C ^b   Lee, C S ^b   Sen, Shashwati ^c   Patil, V B ^a  

^a SOLAPUR UNIVERSITY   (India)

^b Hanyang University   (South Korea)

^c BHABHA ATOMIC RESEARCH CENTRE   (India)

Author keywords

Crystal structure; Electrical properties; Microstructure; Optical properties; Sol gel

Indexed keywords

DC ELECTRICAL CONDUCTIVITY; ELECTRICAL CONDUCTIVITY; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; NANOCRYSTALLINE TIN OXIDES; SELECTED AREA ELECTRON DIFFRACTION; SELECTED AREA ELECTRON DIFFRACTION PATTERN; SOL-GEL SPIN COATING METHOD; TRANSMISSION ELECTRON MICROSCOPY (TEM);

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY; ELECTRIC PROPERTIES; ELECTRON DIFFRACTION; ENERGY GAP; FIELD EMISSION MICROSCOPES; MICROSTRUCTURE; NANOCRYSTALLINE MATERIALS; OPTICAL PROPERTIES; OXIDE FILMS; SOL-GEL PROCESS; SOL-GELS; SURFACE MORPHOLOGY; THIN FILMS; TIN; TIN OXIDES; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET VISIBLE SPECTROSCOPY;

TEMPERATURE;

EID: 84875167196     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2013.02.069     Document Type: Article

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