Nanocrystalline TiO 2 thin films for NH 3 monitoring: Microstructural and physical characterization

Journal of Materials Science: Materials in Electronics

Volumn 23, Issue 1, 2012, Pages 273-279

  Pawar, S G ^a   Patil, S L ^a   Chougule, M A ^a   Raut, B T ^a   Pawar, S A ^a   Mulik, R N ^a   Patil, V B ^a  

^a SOLAPUR UNIVERSITY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

AVERAGE GRAIN SIZE; CONDUCTIVITY MEASUREMENTS; GAS SENSING; GAS SENSING PROPERTIES; HIGH SENSITIVITY; HRTEM IMAGES; MICRO-STRUCTURAL; NANOCRYSTALLINE TIO; NANOCRYSTALLINE TITANIUM OXIDE; OPTICAL AND ELECTRICAL PROPERTIES; PHYSICAL CHARACTERIZATION; SCANNING MICROSCOPY; SELECTED AREA ELECTRON DIFFRACTION; SELECTED AREA ELECTRON DIFFRACTION PATTERN; TETRAGONAL STRUCTURE; TIO; TITANIUM OXIDE THIN FILMS; X-RAY DIFFRACTION MEASUREMENTS;

ELECTRIC PROPERTIES; ELECTRON DIFFRACTION; GAS SENSING ELECTRODES; HIGH RESOLUTION ELECTRON MICROSCOPY; OXIDE MINERALS; THIN FILMS; TITANIUM; X RAY DIFFRACTION;

TITANIUM DIOXIDE;

EID: 84856961990     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-011-0403-0     Document Type: Article

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