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Volumn 509, Issue 41, 2011, Pages 10055-10061
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New process for synthesis of ZnO thin films: Microstructural, optical and electrical characterization
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Author keywords
Band gap; EDAX; HRTEM; SEM; Sol gel method; XRD
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Indexed keywords
ABSORPTION COEFFICIENTS;
AFM;
ANNEALING TEMPERATURES;
AVERAGE GRAIN SIZE;
ELECTRICAL AND OPTICAL PROPERTIES;
ELECTRICAL CONDUCTIVITY;
GLASS SUBSTRATES;
HEXAGONAL WURTZITE STRUCTURE;
HIGH-RESOLUTION TRANSMISSION MICROSCOPIES;
HRTEM;
HRTEM ANALYSIS;
MICRO-STRUCTURAL;
NANOCRYSTALLINE ZNO;
NANOCRYSTALLINES;
OPTICAL AND ELECTRICAL CHARACTERIZATION;
OPTICAL BAND GAP ENERGY;
OPTICAL QUALITIES;
OPTOELECTRONIC APPLICATIONS;
RANDOM ORIENTATIONS;
ROOM TEMPERATURE;
SOL GEL METHOD;
UV-VISIBLE SPECTROSCOPY;
XRD;
XRD MEASUREMENTS;
ZNO FILMS;
ZNO THIN FILM;
ANNEALING;
ATOMIC FORCE MICROSCOPY;
ATOMIC SPECTROSCOPY;
CARRIER CONCENTRATION;
CARRIER MOBILITY;
CRYSTALLITE SIZE;
DC POWER TRANSMISSION;
ELECTRIC CONDUCTIVITY;
ENERGY DISPERSIVE SPECTROSCOPY;
ENERGY GAP;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
METALLIC FILMS;
MORPHOLOGY;
OPTICAL BAND GAPS;
OPTICAL PROPERTIES;
SCANNING ELECTRON MICROSCOPY;
SPIN GLASS;
SUBSTRATES;
SURFACE MORPHOLOGY;
THIN FILMS;
ULTRAVIOLET VISIBLE SPECTROSCOPY;
X RAY DIFFRACTION;
ZINC OXIDE;
ZINC SULFIDE;
OPTICAL FILMS;
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EID: 80052962747
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2011.08.030 Document Type: Article |
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Times cited : (43)
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References (23)
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