Extended component importance measures considering aleatory and epistemic uncertainties

IEEE Transactions on Reliability

Volumn 62, Issue 1, 2013, Pages 49-65

  Sallak, Mohamed ^a   Schön, Walter ^a   Aguirre, Felipe ^a  

^a UNIVERSITÉ DE TECHNOLOGIE DE COMPIÈGNE   (France)

Author keywords

Affine arithmetic; Dempster Shafer theory; epistemic uncertainty; experts' judgments; importance measures; pignistic reliability

Indexed keywords

AFFINE ARITHMETIC; DEMPSTER-SHAFER THEORY; EPISTEMIC UNCERTAINTIES; EXPERTS' JUDGMENTS; IMPORTANCE MEASURE;

MONTE CARLO METHODS;

UNCERTAINTY ANALYSIS;

EID: 84874957674     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2013.2240888     Document Type: Article

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