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Advanced Functional Materials

Volumn 23, Issue 9, 2013, Pages 1129-1136

Thickness-dependent structure-property relationships in strained (110) SrRuO3 Thin Films

(4) Kan, Daisuke a Aso, Ryotaro a Kurata, Hiroki a Shimakawa, Yuichi a

a JAPAN SCIENCE AND TECHNOLOGY AGENCY (Japan)

Author keywords

epitaxial perovskite thin films; octahedral rotation; SrRuO3; strain accommodation

Indexed keywords

CLOSE RELATIONSHIPS; EASY AXIS; EPITAXIAL STRAIN; EPITAXIALLY STABILIZED; KEY FACTORS; MONOCLINIC STRUCTURES; OCTAHEDRAL ROTATIONS; PEROVSKITE OXIDE THIN FILMS; PEROVSKITE THIN FILMS; SRRUO3; STRAIN ACCOMMODATIONS; STRUCTURAL AND PHYSICAL PROPERTIES; STRUCTURAL CHANGE; STRUCTURE PHASIS; STRUCTURE PROPERTY RELATIONSHIPS; TETRAGONAL STRUCTURE; THIN-FILM STRUCTURE;

EPITAXIAL FILMS; EPITAXIAL GROWTH; PEROVSKITE; PHYSICAL PROPERTIES; ROTATION; RUTHENIUM ALLOYS; RUTHENIUM COMPOUNDS; SUBSTRATES;

FILM THICKNESS;

EID: 84874717796 PISSN: 1616301X EISSN: 16163028 Source Type: Journal
DOI: 10.1002/adfm.201202402 Document Type: Article

Times cited : (63)

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