Strain effect on structural transition in SrRuO3 epitaxial thin films

Crystal Growth and Design

Volumn 11, Issue 12, 2011, Pages 5483-5487

  Kan, Daisuke ^a   Shimakawa, Yuichi ^a  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL THIN FILMS; FILM STRUCTURE; FILMS THINNER; HIGH TEMPERATURE; LOW TEMPERATURES; ORTHORHOMBIC PHASE; ORTHORHOMBIC UNIT CELL; PSEUDOCUBIC; RECIPROCAL SPACE MAPPING; ROTATION PATTERN; SHARP TRANSITION; SRTIO; STRAIN EFFECT; STRUCTURAL CHARACTERIZATION; STRUCTURAL TRANSITIONS; SUBSTRATE-INDUCED STRAIN; X-RAY DIFFRACTION MEASUREMENTS;

EPITAXIAL GROWTH; MAPPING; ROTATION; RUTHENIUM ALLOYS; RUTHENIUM COMPOUNDS; X RAY DIFFRACTION;

EPITAXIAL FILMS;

EID: 83055164409     PISSN: 15287483     EISSN: 15287505     Source Type: Journal    
DOI: 10.1021/cg201070n     Document Type: Article

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