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Volumn 9, Issue 5, 2013, Pages 779-784

Lattice deformation and domain distortion in the self-assembly of block copolymer thin films on chemical patterns

Author keywords

atomic force microscopy; block copolymers; chemical patterns; self assembly

Indexed keywords

A TRANSITIONS; BLOCK COPOLYMER THIN FILMS; CHEMICAL PATTERN; FREE-ENERGY MODEL; LATTICE DEFORMATION; MICRO-DOMAINS; NATURAL PERIOD; SPATIAL PERIODS; STRIPE PATTERN; STRIPE WIDTH;

EID: 84874674115     PISSN: 16136810     EISSN: 16136829     Source Type: Journal    
DOI: 10.1002/smll.201201950     Document Type: Article
Times cited : (5)

References (27)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.