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Volumn , Issue , 2012, Pages 201-204
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Temperature considerations on Hall Effect sensors current-related sensitivity behaviour
a
EPFL
(Switzerland)
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Author keywords
[No Author keywords available]
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Indexed keywords
ACCURATE PREDICTION;
ANALYTICAL INVESTIGATIONS;
CMOS INTEGRATION;
FREEZE OUT;
HALL SENSOR;
HALL-EFFECT SENSORS;
PARABOLIC CURVE;
PERTINENT CONSIDERATIONS;
TEMPERATURE BEHAVIOR;
TEMPERATURE DEPENDENCE;
HALL EFFECT;
HALL EFFECT TRANSDUCERS;
SENSORS;
SENSITIVITY ANALYSIS;
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EID: 84874608536
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ICECS.2012.6463766 Document Type: Conference Paper |
Times cited : (16)
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References (8)
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