A specific parameters analysis of CMOS hall effect sensors with various geometries

Proceedings of the 19th International Conference - Mixed Design of Integrated Circuits and Systems, MIXDES 2012

Volumn , Issue , 2012, Pages 335-339

  Paun, Maria Alexandra ^a   Sallese, Jean Michel ^a   Kayal, Maher ^a  

^a EPFL   (Switzerland)

Author keywords

Hall effect sensor; individual and residual offset drift; temperature coefficient

Indexed keywords

CHARACTERISTIC MEASUREMENTS; DIFFERENT GEOMETRY; HALL-EFFECT SENSORS; OFFSET DRIFT; OPTIMUM CELL; PARAMETERS ANALYSIS; PERFORMANCE SPECIFICATIONS; TEMPERATURE BEHAVIOR; TEMPERATURE COEFFICIENT;

GEOMETRY; HALL EFFECT; INTEGRATED CIRCUITS;

SENSORS;

EID: 84864267632     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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