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Volumn 72, Issue 4, 2010, Pages 257-271

Geometry influence on the Hall effect devices performance

Author keywords

Geometrical correction factor; Hall effect sensors; Hall Voltage; Power dissipated; Sensitivity

Indexed keywords

GEOMETRICAL CORRECTION; HALL EFFECT SENSORS; HALL VOLTAGE; POWER DISSIPATED; SENSITIVITY;

EID: 78649901446     PISSN: 12237027     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (30)

References (7)
  • 1
    • 0003920493 scopus 로고    scopus 로고
    • Institute of Physics Publishing, Second Edition
    • R. S Popovic, Hall Effect Devices, Second Edition, Institute of Physics Publishing, 2004
    • (2004) Hall Effect Devices
    • Popovic, R.S.1
  • 2
    • 77955718617 scopus 로고    scopus 로고
    • Self-consistent calculation of electric potentials in Hall devices
    • T. Kramer, V. Krueckl, E. J. Heller, R. E. Parrott, Self-consistent calculation of electric potentials in Hall devices, Physical Review B, Vol. 81, 205306, 2010
    • (2010) Physical Review B. , vol.81 , pp. 205306
    • Kramer, T.1    Krueckl, V.2    Heller, E.J.3    Parrott, R.E.4
  • 3
    • 78649866236 scopus 로고    scopus 로고
    • Honeywell References, Micro Switch Sensing and Control, Chapter 2, Hall Effect Sensors
    • Honeywell References, Micro Switch Sensing and Control, Chapter 2, Hall Effect Sensors
  • 4
    • 85008049866 scopus 로고    scopus 로고
    • Parallel-field silicon hall effect microsensors with minimal design complexity
    • S. V. Lozanova, C. S. Roumenin, Parallel-Field Silicon Hall Effect Microsensors with Minimal Design Complexity, IEEE Sensors Journal, Vol. 9, No. 7, 761, 2009
    • (2009) IEEE Sensors Journal , vol.9 , Issue.7 , pp. 761
    • Lozanova, S.V.1    Roumenin, C.S.2
  • 6
    • 33750695298 scopus 로고    scopus 로고
    • Automatic calibration of Hall sensor microsystems
    • M. Kayal, M. Pastre, Automatic calibration of Hall sensor microsystems, Microelectronics Journal Vol. 37, 2006, pp. 1569-1575
    • (2006) Microelectronics Journal , vol.37 , pp. 1569-1575
    • Kayal, M.1    Pastre, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.