Spectroscopic, microscopic, and electrical characterization of nanostructured SnO2:Co thin films prepared by sol-gel spin coating technique

Materials Research Bulletin

Volumn 48, Issue 4, 2013, Pages 1468-1476

  Mazloom, J ^a   Ghodsi, F E ^a  

^a UNIVERSITY OF GUILAN   (Iran)

Author keywords

A. Thin film; B. Electrical properties; B. Sol gel; D. Optical properties

Indexed keywords

AFM; AFM IMAGE; BLUE EMISSION; CO CONTENT; CO-DOPANTS; COBALT CONCENTRATION; DOPANT CONCENTRATIONS; DOPING CONCENTRATION; ELECTRICAL CHARACTERIZATION; ELECTRICAL RESISTIVITY; FTIR; GRAIN SIZE; GREEN EMISSIONS; HALL EFFECT MEASUREMENT; NANO-STRUCTURED; OPTICAL PROPERTIES OF THIN FILMS; P-TYPE; PL MEASUREMENTS; SOL-GEL SPIN COATING; TETRAGONAL RUTILE STRUCTURE; XRD;

COATINGS; COBALT; ELECTRIC CONDUCTIVITY; OPTICAL PROPERTIES; OXIDE MINERALS; SEMICONDUCTOR DOPING; SOL-GEL PROCESS; SOL-GELS; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

FILM PREPARATION;

EID: 84874336748     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2012.12.069     Document Type: Article

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