Origin of variation in switching voltages in threshold-switching phenomena of VO2 thin films

Applied Physics Letters

Volumn 102, Issue 6, 2013, Pages

  Lee, S B ^a   Kim, K ^a   Oh, J S ^a   Kahng, B ^a   Lee, J S ^b  

^a Seoul National University   (South Korea)

^b Korea Institute for Advanced Study   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

INSULATOR TO METAL; LOAD RESISTANCES; SIMULATION ANALYSIS; SWITCHING VOLTAGES; VOLTAGE SIGNALS;

SEMICONDUCTOR INSULATOR BOUNDARIES; THIN FILMS; VOLTAGE MEASUREMENT;

SWITCHING;

EID: 84874232531     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4790842     Document Type: Article

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