SCOPUS 정보 검색 플랫폼

Review of Scientific Instruments

Volumn 84, Issue 1, 2013, Pages

Large-field high-contrast hard x-ray Zernike phase-contrast nano-imaging beamline at Pohang Light Source

(5) Lim, Jun a Park, So Yeong b Huang, Jung Yun a Han, Sung Mi c Kim, Hong Tae c

a POSTECH (South Korea)

b Pohang University of Science and Technology (POSTECH) (South Korea)

c Catholic University of Daegu (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

BEAM LINES; BIO-SAMPLES; HALO EFFECT; HARD X RAY; HIGH CONTRAST; HIGH-CONTRAST IMAGES; LARGE FIELD OF VIEWS; NANO-IMAGING; OFF-AXIS ILLUMINATION; PHASE-CONTRAST; POHANG LIGHT SOURCE; ZERNIKE; ZERNIKE PHASE;

EQUIPMENT; INSTRUMENTS;

LIGHT SOURCES;

SILICON DIOXIDE;

ARTICLE; CHEMISTRY; CYTOLOGY; EQUIPMENT; EQUIPMENT DESIGN; IMAGE PROCESSING; LIGHT; MACROPHAGE; NANOTECHNOLOGY; PHASE CONTRAST MICROSCOPY; X RAY; DEVICES;

EQUIPMENT DESIGN; IMAGE PROCESSING, COMPUTER-ASSISTED; LIGHT; MACROPHAGES; MICROSCOPY, PHASE-CONTRAST; NANOTECHNOLOGY; SILICON DIOXIDE; X-RAYS;

EID: 84874038711 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.4789362 Document Type: Article

Times cited : (16)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.