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Volumn , Issue , 2012, Pages

Temperature influence investigation on Hall Effect sensors performance using a lumped circuit model

Author keywords

[No Author keywords available]

Indexed keywords

DIFFERENT SHAPES; FINITE ELEMENT MODELS; HALL FACTOR; HALL VOLTAGE; HALL-EFFECT SENSORS; LUMPED CIRCUIT MODELS; PHYSICAL PARAMETERS; TEMPERATURE INFLUENCE;

EID: 84873970184     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSENS.2012.6411328     Document Type: Conference Paper
Times cited : (5)

References (7)
  • 2
    • 78649901446 scopus 로고    scopus 로고
    • Geometry influence on hall effect devices performance
    • M.A. Paun, J.M. Sallese, and M. Kayal, "Geometry influence on Hall effect devices performance", U.P.B. Sci. Bull., Series A, Vol. 72, No. 4, 2010, p. 257-271
    • (2010) U.P.B. Sci. Bull., Series A , vol.72 , Issue.4 , pp. 257-271
    • Paun, M.A.1    Sallese, J.M.2    Kayal, M.3
  • 5
    • 0003920493 scopus 로고    scopus 로고
    • Second Edition, Institute of Physics Publishing
    • R. S. Popovic, Hall Effect Devices, Second Edition, Institute of Physics Publishing, 2004
    • (2004) Hall Effect Devices
    • Popovic, R.S.1
  • 6
    • 77956057590 scopus 로고    scopus 로고
    • How to extract the sheet resistance and hall mobility from arbitrarily shaped planar four-terminal devices with extended contacts
    • M. Cornils, A. Rottmann, and O. Paul, "How to Extract the Sheet Resistance and Hall Mobility From Arbitrarily Shaped Planar Four-Terminal Devices With Extended Contacts", IEEE Transactions On Electron Devices, Vol. 57, No. 9, 2010, p. 2087-2097
    • (2010) IEEE Transactions on Electron Devices , vol.57 , Issue.9 , pp. 2087-2097
    • Cornils, M.1    Rottmann, A.2    Paul, O.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.