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Volumn , Issue , 2012, Pages
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Temperature influence investigation on Hall Effect sensors performance using a lumped circuit model
a
EPFL
(Switzerland)
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Author keywords
[No Author keywords available]
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Indexed keywords
DIFFERENT SHAPES;
FINITE ELEMENT MODELS;
HALL FACTOR;
HALL VOLTAGE;
HALL-EFFECT SENSORS;
LUMPED CIRCUIT MODELS;
PHYSICAL PARAMETERS;
TEMPERATURE INFLUENCE;
CIRCUIT THEORY;
FINITE ELEMENT METHOD;
HALL EFFECT;
HALL MOBILITY;
LUMPED PARAMETER NETWORKS;
SENSORS;
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EID: 84873970184
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ICSENS.2012.6411328 Document Type: Conference Paper |
Times cited : (5)
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References (7)
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