Device modelling and model verification for the Euclid CCD273 detector

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8453, Issue , 2012, Pages

  Clarke, A ^a   Hall, D ^a   Murray, N ^a   Holland, A ^a   Burt, D ^b  

^a OPEN UNIVERSITY   (United Kingdom)

^b E2V TECHNOLOGIES   (United Kingdom)

Author keywords

CCD; CTE; Device modelling; Euclid; Radiation damage

Indexed keywords

CHARGE INTERACTIONS; CTE; DARK ENERGY; DEVICE MODELLING; DEVICE MODELS; EUCLID; FULL WELL CAPACITY; MINIMAL DISTORTION; MODEL VERIFICATION; MONTE CARLO; POST PROCESSING; SOLAR PROTONS;

CHARGE COUPLED DEVICES; CHARGE TRANSFER; GALAXIES; INFRARED DETECTORS;

RADIATION DAMAGE;

EID: 84873347123     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.925887     Document Type: Conference Paper

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