Modelling charge transfer in a radiation damaged Charge Coupled Device for Euclid

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8453, Issue , 2012, Pages

  Hall, David J ^a   Holland, Andrew ^a   Murray, Neil ^a   Gow, Jason ^a   Clarke, Andrew ^a  

^a OPEN UNIVERSITY   (United Kingdom)

Author keywords

CCD; CTE; CTI; Euclid; Radiation damage; Simulation

Indexed keywords

CHARGE STORAGE; CHARGE TRANSFER EFFICIENCY; CTE; CTI; DEVICE PERFORMANCE; DISPLACEMENT DAMAGES; EUCLID; EXPONENTIAL TIME CONSTANT; GAIA MISSION; HOSTILE RADIATION; MONTE CARLO SIMULATION; SHOCKLEY-READ-HALL THEORIES; SIGNAL ELECTRONS; SILVACO SIMULATION; SIMULATION; STABLE TRAPS; TRANSFER OF CHARGES; TRAP DENSITY; TRAP PARAMETERS;

ASTRONOMY; CHARGE COUPLED DEVICES; CHARGE TRANSFER; INFRARED DETECTORS; MONTE CARLO METHODS; PROTONS; RADIATION DAMAGE; THREE DIMENSIONAL COMPUTER GRAPHICS;

THREE DIMENSIONAL;

EID: 84873378682     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.925394     Document Type: Conference Paper

References (16)

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