Mitigating radiation-induced charge transfer inefficiency in full-frame CCD applications by 'pumping' traps

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8453, Issue , 2012, Pages

  Murray, N J ^a   Holland, A D ^a   Gow, J P D ^a   Hall, D J ^a   Tutt, J H ^a   Burt, D ^b   Endicott, J ^b  

^a OPEN UNIVERSITY   (United Kingdom)

^b E2V TECHNOLOGIES   (United Kingdom)

Author keywords

CCD; CTE; CTI; P channel; Pocket pumping; Transfer; Traps

Indexed keywords

CTE; CTI; P-CHANNEL; TRANSFER; TRAPS;

ALGORITHMS; ASTRONOMY; CHARGE COUPLED DEVICES; CHARGE TRANSFER; IMAGE RECONSTRUCTION; INFRARED DETECTORS; RADIATION DAMAGE;

PUMPS;

EID: 84873392333     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.926804     Document Type: Conference Paper

References (10)

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