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Volumn 45, Issue 1, 2013, Pages 93-96
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Surface topography effects in C60 bombardment of Si
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Author keywords
C60+; carbon; dynamics SIMS; molecular dynamics simulations; silicon
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Indexed keywords
C60+;
CARBON ATOMS;
FLUENCES;
IMPACT POINT;
LOCAL REGION;
LOCAL TOPOGRAPHY;
MOLECULAR DYNAMICS SIMULATIONS;
MULTI-IMPACT;
NORMAL INCIDENCE;
PROJECTILE IMPACT;
ROOT MEAN SQUARE ROUGHNESS;
SPUTTERED ATOMS;
SURFACE HEIGHT;
CARBON;
MOLECULAR DYNAMICS;
SILICON;
PROJECTILES;
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EID: 84872860217
PISSN: 01422421
EISSN: 10969918
Source Type: Journal
DOI: 10.1002/sia.4965 Document Type: Conference Paper |
Times cited : (6)
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References (18)
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