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Volumn 45, Issue 1, 2013, Pages 93-96

Surface topography effects in C60 bombardment of Si

Author keywords

C60+; carbon; dynamics SIMS; molecular dynamics simulations; silicon

Indexed keywords

C60+; CARBON ATOMS; FLUENCES; IMPACT POINT; LOCAL REGION; LOCAL TOPOGRAPHY; MOLECULAR DYNAMICS SIMULATIONS; MULTI-IMPACT; NORMAL INCIDENCE; PROJECTILE IMPACT; ROOT MEAN SQUARE ROUGHNESS; SPUTTERED ATOMS; SURFACE HEIGHT;

EID: 84872860217     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.4965     Document Type: Conference Paper
Times cited : (6)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.