Coating thickness and interlayer effects on CVD-diamond film adhesion to cobalt-cemented tungsten carbides

Surface and Coatings Technology

Volumn 215, Issue , 2013, Pages 272-279

  Lu, Ping ^a   Gomez, Humberto ^b,d   Xiao, Xingcheng ^c   Lukitsch, Michael ^c   Durham, Delcie ^b   Sachdeve, Anil ^c   Kumar, Ashok ^b   Chou, Kevin ^a  

^a University of Alabama   (United States)

^b University of South Florida   (United States)

^c GENERAL MOTORS CORPORATION   (United States)

^d UNIVERSIDAD DEL NORTE   (Colombia)

Author keywords

Adhesion; Coating delamination; Diamond coating; Interlayer; Scratch testing

Indexed keywords

ACOUSTIC EMISSION SIGNAL; CHEMICAL ETCHING; COATING DELAMINATION; COATING THICKNESS; COMMERCIAL INSTRUMENTS; CRITICAL LOAD; CVD DIAMOND FILMS; DIAMOND COATING; DIAMOND DEPOSITION; HOT-FILAMENT CHEMICAL VAPOR DEPOSITION; INTERLAYER; INTERLAYER MATERIALS; LINEAR RELATION; POOR ADHESION; SCRATCH TESTING; SUBSTRATE SURFACE; SUBSTRATE SURFACE PREPARATION; TANGENTIAL FORCE; TOOL PERFORMANCE; WHITE-LIGHT INTERFEROMETRY;

ADHESION; CHEMICAL VAPOR DEPOSITION; CHROMATE COATINGS; CHROMIUM; COBALT; DELAMINATION; DIAMOND CUTTING TOOLS; DIAMOND FILMS; ETCHING; INSTRUMENT TESTING; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; THICKNESS MEASUREMENT; TUNGSTEN; TUNGSTEN ALLOYS; VAPORS;

TUNGSTEN CARBIDE;

EID: 84872685333     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2012.08.093     Document Type: Article

References (21)

1. Hu J., Chou Y.K., Thompson R.G. Trans. NAMRI/SME 2007, 35:177.
2. Lu P., Chou Y.K., Thompson R.G. Proc. 2009 Int. Manuf. Sci. and Eng. Conf 2009, (MSEC2009-84372).
3. Qin F., Hu J., Chou Y.K., Thompson R.G. Wear 2009, 267:991.
4. Polini R., Barletta M. Diamond Relat. Mater. 2008, 17:325.
5. Polini R., Mantini F.P., Barletta M., Valle R., Casadei F. Diamond Relat. Mater. 2006, 15:1284.
6. Xu Z., Lev L., Lukitsch M., Kumar A. Diamond Relat. Mater. 2007, 16:461.
7. Oakes J., Pan X.X., Haubner R., Lux B. Surf. Coat. Technol. 1991, 47:600.
8. Cappelli E., Pinzari F., Ascarelli P., Righini G. Diamond Relat. Mater. 1996, 5:292.
9. Deuerler F., van den Berg H., Tabersky R., Freundlieb A., Pies M., Buck V. Diamond Relat. Mater. 1996, 5:1478.
10. Gomez H., Durham D., Xiao X., Lukitsch M., Lu P., Chou K., Sachdev A., Kumar A. J. Mater. Process. Technol. 2012, 212:523.
11. Buijnsters J.G., Shankar P., Fleischer W., van Enckevort W.J.P., Schermer J.J., ter Meulen J.J. Diamond Relat. Mater. 2002, 11:536.
12. Silva F.J.G., Baptista A.P.M., Pereira E., Teixeira V., Fan Q.H., Fernandes A.J.S., Cost F.M. Diamond Relat. Mater. 2002, 11:1617.
13. Perry A.J. Thin Solid Films 1983, 107:167.
14. Bull S.J. ECSC, EEC, EAEC 1992, 31. W. Gissler, H.A. Jehn (Eds.).
15. Ollendorf H., Schneider D. Surf. Coat. Technol. 1999, 113:86.
16. Jaworski R., Pawlowski L., Roudet F., Kozerski S., Petit F. Surf. Coat. Technol. 2008, 202:2644.
17. Nakao S., Kim J., Choi J., Miyagawa S., Miyagawa Y., Ikeyama M. Surf. Coat. Technol. 2007, 201:8334.
18. Lu P., Xiao X., Lukitsch M., Sachdev A., Chou Y.K. Surf. Coat. Technol. 2011, 206:1860.
19. Xiao X., Sheldon B.W., Konca E., Lev L.C., Lukitsch M.J. Diamond Relat. Mater. 2009, 18:1114.
20. Qin F., Chou Y.K., Nolen D., Thompson R.G. Surf. Coat. Technol. 2009, 204:1056.
21. Huang B., Zhao M., Zhang T. Phil. Mag. 2004, 84:1233.