Interface characterizations of diamond-coated tools by scratch testing and simulations

Surface and Coatings Technology

Volumn 206, Issue 7, 2011, Pages 1860-1866

  Lu, P ^a   Xiao, X ^b   Lukitsch, M ^b   Sachdev, A ^b   Chou, Y K ^a  

^a University of Alabama   (United States)

^b GENERAL MOTORS CORPORATION   (United States)

Author keywords

Diamond coated carbide tools; Finite element; Interface; Scratch testing

Indexed keywords

ACOUSTIC EMISSION SIGNAL; COATING ADHESION; COATING DELAMINATION; COATING INTERFACES; CRITICAL LOAD; FE-SIMULATION; FINITE ELEMENT; FINITE ELEMENT MODELS; HIGH INTENSITY; INTERFACE CHARACTERISTIC; INTERFACE CHARACTERIZATION; MAXIMUM STRENGTH; MICRO-SCRATCH TEST; NORMAL FORCES; SCRATCH TEST; SCRATCH TESTING; TANGENTIAL FORCE; THREE-DIMENSIONAL (3D);

ADHESION; CARBIDE TOOLS; COATINGS; DELAMINATION; DIAMONDS; FINITE ELEMENT METHOD; FRACTURE TESTING; INTERFACES (MATERIALS); LOAD TESTING; STEEL SHEET; THREE DIMENSIONAL; TUNGSTEN; TUNGSTEN CARBIDE;

ACOUSTIC EMISSION TESTING;

EID: 82755160733     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2011.08.022     Document Type: Article

References (19)

1. Hu J., Chou Y.K., Thompson R.G. Trans. NAMRI/SME 2007, 35:177.
2. Lu P., Chou Y.K., Thompson R.G. Proc. 2009 Int. Manuf. Sci. and Eng. Conf 2009, MSEC2009-84372.
3. Qin F., Hu J., Chou Y.K., Thompson R.G. Wear 2009, 267:991.
4. Perry A.J. Thin Solid Films 1983, 107:167.
5. Bull S.J. ECSC, EEC, EAEC 1992, 31. W. Gissler, H.A. Jehn (Eds.).
6. Ollendorf H., Schneider D. Surf. Coat. Technol. 1999, 113:86.
7. Jaworski R., Pawlowski L., Roudet F., Kozerski S., Petit F. Surf. Coat. Technol. 2008, 202:2644.
8. Nakao S., Kim J., Choi J., Miyagawa S., Miyagawa Y., Ikeyama M. Surf. Coat. Technol. 2007, 201:8334.
9. Liu F.X., Yang F.Q., Gao Y.F., Jiang W.H., Guan Y.F., Rack P.D., Sergic O., Liaw P.K. Surf. Coat. Technol. 2009, 203:3480.
10. Xie Y., Hawthorne H.M. Surf. Coat. Technol. 2002, 155:121.
11. Xu Z., Li X. Acta Mater. 2005, 53:1913.
12. K.L. Mittal, V.S.P. Intl Sci. Netherland. (2001).
13. Renaud A., Hu J., Qin F., Chou Y.K. Int. J. Mechatron. Manuf. Syst. 2009, 2:490.
14. Giannakopoulos A.E., Suresh S. Scr. Mater. 1999, 40:1191.
15. Ramamurty U., Sridhar S., Giannakopoulos A.E., Suresh S. Acta Mater. 1999, 47:2417.
16. Venkatesh T.A., Van Vliet K.J., Giannakopoulos A.E., Suresh S. Scr. Mater. 2000, 42:833.
17. Chowdhury S., de Barra E., Laugier M.T. Diamond Relat. Mater. 2004, 13:1625.
18. Deueler F., Lemmer O., Frank M., Pohl M., Heßing C. Int. J. Refract. Met. Hard Mater. 2002, 20:115.
19. Hu J., Chou Y.K., Thompson R.G. Surf. Coat. Technol. 2008, 203:730.