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Solid State Communications

Volumn 154, Issue 1, 2013, Pages 15-18

Few-layer graphene under high pressure: Raman and X-ray diffraction studies

(4) Clark, S M a Jeon, Ki Joon b Chen, Jing Yin c Yoo, Choong Shik c

a MACQUARIE UNIVERSITY (Australia)

b University of Ulsan (South Korea)

c WASHINGTON STATE UNIVERSITY (United States)

Author keywords

A. Graphene; C. Raman spectroscopy; C. X ray diffraction; E. High pressure; E. Synchrotron radiation

Indexed keywords

E. HIGH-PRESSURE; E. SYNCHROTRON RADIATION; EFFECT OF PRESSURE; FEW-LAYER GRAPHENE; GRAPHITIC LAYERS; HIGH PRESSURE; INTERLAYER DISTANCE; LONG RANGE ORDERS; X-RAY DIFFRACTION STUDIES;

HYDRAULICS; HYDRODYNAMICS; RAMAN SPECTROSCOPY; X RAY DIFFRACTION;

GRAPHENE;

EID: 84872110934 PISSN: 00381098 EISSN: None Source Type: Journal
DOI: 10.1016/j.ssc.2012.10.002 Document Type: Article

Times cited : (128)

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