Metrology and instrumentation challenges with high-rate, roll-to-roll manufacturing of flexible electronic systems

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8466, Issue , 2012, Pages

  Subbaraman, Harish ^a   Lin, Xiaohui ^b   Xu, Xiaochuan ^b   Dodabalapur, Ananth ^b   Guo, L Jay ^c   Chen, Ray T ^b  

^a Omega Optics Inc   (United States)

^b The University of Texas at Austin   (United States)

^c UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Flexible electronics; Inspection; Manufacturing; Printing; Roll to roll

Indexed keywords

ADAPTIVE CONTROL; DIAGNOSTIC TOOLS; ELECTRONIC COMPONENT; FLEXIBLE ELECTRONIC SYSTEMS; HARDWARE TOOLS; HIGH QUALITY; HIGH RATE; MANUFACTURING PROCESS; OFF-LINE INSPECTIONS; PRINT MEDIA; RESOLUTION REQUIREMENTS; ROLL TO ROLL; ROLL TO ROLL MANUFACTURING; SYSTEM HARDWARE; WEB SPEED;

ELECTRONICS ENGINEERING; FLEXIBLE ELECTRONICS; HARDWARE; INSPECTION; INSTRUMENTS; MANUFACTURE; MEASUREMENTS; PRINTING;

UNITS OF MEASUREMENT;

EID: 84872108323     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.940778     Document Type: Conference Paper

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